By Mehdi Dehbashi,Görschwin Fey
This booklet describes computerized debugging methods for the insects and the faults which look in several abstraction degrees of a procedure. The authors hire a transaction-based debug method of structures on the transaction-level, announcing the proper relation of transactions. the automatic debug method for layout insects reveals the aptitude fault applicants at RTL and gate-level of a circuit. Debug concepts for good judgment insects and synchronization insects are tested, allowing readers to localize the main tough insects. Debug automation for electric faults (delay faults)finds the possibly failing speedpaths in a circuit at gate-level. a number of the debug ways defined in attaining excessive analysis accuracy and decrease the debugging time, shortening the IC improvement cycle and extending the productiveness of designers.
- Describes a unified framework for debug automation used at either pre-silicon and post-silicon stages;
- Provides methods for debug automation of a approach at diverse degrees of abstraction, i.e., chip, gate-level, RTL and transaction level;
- Includes suggestions for debug automation of layout insects and electric faults, in addition to an infrastructure to debug NoC-based multiprocessor SoCs.
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Debug Automation from Pre-Silicon to Post-Silicon by Mehdi Dehbashi,Görschwin Fey